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MOSFET Semiconductor Detector Systems Atomic Layer Deposition Equipment ISO

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Address: CSCES strait screen and core intelligent manufacturing base,Shuangliu District,Chengdu City, Sichuan Province, P. R. China

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ZEIT Group

MOSFET Semiconductor Detector Systems Atomic Layer Deposition Equipment ISO

Country/Region china
City & Province chengdu sichuan
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Product Details

Atomic Layer Deposition in Semiconductor Industry
 
 
Applications

    Applications    Specific Purpose
    Semiconductor

    Logic device (MOSFET), High-K gate dielectrics / gate electrode

    High-K capacitive material / capacitive electrode of Dynamic Random Access
    Memory (DRAM)

    Metal interconnection layer, metal passivation layer, metal seed crystal layer, metal
    diffusion barrier layer

    Non-volatile memory:flash memory, phase change memory, resistive random access
    memory, ferroelectric memory, 3D packaging, OLED passivation layer,etc.

 
Working Principle
Atomic layer deposition (ALD) technology, also known as atomic layer epitaxy (ALE) technology, is a chemical

vapor film deposition technology based on ordered and surface self-saturated reaction. ALD is applied in

semiconductor field. As Moore’s Law evolves constantly and the feature sizes and etching grooves of integrated

circuits have been constantly miniaturizing, the smaller and smaller etching grooves have been bringing severe

challenges to the coating technology of grooves and their side walls.Traditional PVD and CVD process have been

unable to meet the requirements of superior step coverage under narrow line-width. ALD technology is playing an

increasingly important role in semiconductor industry due to its excellent shape-keeping, uniformity and higher step

coverage.
 
Features

  Model   ALD-SEM-X—X
  Coating film system   AL2O3, TiO2, ZnO, etc
  Coating temperature range   Normal temperature to 500℃ (Customizable)
  Coating vacuum chamber size

   Inner diameter: 1200mm, Height: 500mm (Customizable)

  Vacuum chamber structure   According to customer’s requirements
  Background vacuum   <5×10-7mbar
  Coating thickness   ≥0.15nm
  Thickness control precision   ±0.1nm
  Coating size   200×200mm² / 400×400mm² / 1200×1200 mm², etc
  Film thickness uniformity   ≤±0.5%
  Precursor and carrier gas

   Trimethylaluminum, titanium tetrachloride, diethyl zinc, pure water,
   nitrogen, etc.

  Note: Customized production available.

                                                                                                                
Coating Samples

 

Process Steps
→ Place the substrate for coating into the vacuum chamber;
→ Vacuumize the vacuum chamber at high and low temperature, and rotate the substrate synchronously;
→ Start coating: the substrate is contacted with precursor in sequence and without simultaneous reaction.
→ Purge it with high-purity nitrogen gas after each reaction;
→ Stop rotating the substrate after the film thickness is up to standard and the operation of purging and cooling is

     completed, then take out the substrate after the vacuum breaking conditions are met.
 
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