TH1991 Precision Source Measure Unit with 7-inch Capacitive Touch
Screen
A Source Measure Unit (SMU) is a versatile electronic instrument
that combines the functions of a power supply and a digital
multimeter. It is widely used in various applications requiring
precise and simultaneous sourcing and measuring of electrical
parameters.
Performance Characteristics
TH1991/TH1992 series precision source/measure units can output and
measure voltage and current at the same time. The instrument
integrates the functions of current source, voltage source,
voltmeter and ammeter, and each function can be switched
arbitrarily.
TH1991/TH1992 series precision source/measure units can output up
to ±210V DC voltage, ±3A DC current and ±10.5A pulse current,
minimum 10fA/100nV power supply and measurement resolution, support
high-speed sampling, and can generate arbitrary waveforms.
TH1991/TH1992 series precision source/measure unit series adopts
7-inch capacitive touch screen, with Linux operating system as the
bottom layer, interactive graphical user interface and various
display modes, and built-in diodes, triodes, MOS tubes and IGBTs
and other devices. The I/V curve scanning function can complete the
IV function test without connecting to the host computer, which can
signififi cantly improve the test effiffiffi ciency.
The TH1991/TH1992 series of precision source/measure units with
comprehensive and integrated power and measurement functions are
ideal for testing semiconductors, active/passive devices, and a
variety of other devices and materials.
The TH1991/TH1992 series of precision source/measure units are
widely used in R&D and educational applications, industrial
development, testing and manufacturing.
Performance Characteristics
• 7-inch capacitive touch screen, resolution 800×480
• Linux operating system
• Four-quadrant precision power output and measurement
• Single/dual channel output and measurement
• Up to ±210V DC voltage, ±3A DC current/±10.5A pulse
• 10fA/100nV minimum measurement resolution (6 1/2 digits)
• 10fA/100nV minimum supply resolution (6 1/2 digits)
• Up to 1,000,000 dots/sec sampling rate
• Arbitrary waveform generation
• List scan function (minimum 1μs interval)
• Direct generation of I/V curves of diodes, triodes, MOS tubes and
IGBTs
Application
• Semiconductor, discrete and passive component testing
Diodes, Laser Diodes, LEDs
Photodetectors, Sensors
Field effff ect transistor, triode
ICs (ICs, RFICs, MMICs)
Resistors, rheostats, thermistors, switches
• Precision electronics and green energy device testing
PV
Power semiconductor
Battery
Car
Medical instrument
Power and DC Bias Sources for Board Level Testing
• Research and Education
New material research
Nanodevice properties
Giant magnetoresistance
Organic equipment
Any precision I/V source or measure
Shelf volume (mm): 125x132x480
Outline volume (mm): 236x154x526
Net weight: about 6kg (single channel) / 7.5kg (dual channel)
Standard accessories:
Sharp needle test probe
Banana plug
Tonghui PC software
One power cord
One USB cable
Accessories
Optional accessories:
GPIB adapter board
Low noise fifi lter
Kelvin probe set
Banana to Triaxial Adapter (2-wire or 4-wire)
Triaxial connection test fifi xture
Features
• 10fA current output and measurement resolution; 100nV voltage
output and component resolution
• ±210V maximum voltage output; ±3.03A (DC)/±10.5A (pulse) maximum
current output.
• Support DC, pulse, sweep and list output.
• Minimum sampling interval 1μs
• Built-in I/V curve sweep function, time-domain waveform scrolling
display function
• The pulse width of the pulse output can be as small as 50μs
• Both two-wire measurement / four-wire measurement
• The output fifilter time constant (or cutoffff frequency) can be
freely set to achieve any frequency response output
• 14-level sorting function, including Grading and Sorting modes.
• Math operation function, moving average fifilter function,
deviation subtraction function
• Semiconductor parameter analysis function to quickly generate
characteristic curves of commonly used devices.
• Four basic modes of voltage source, current source, voltmeter,
ammeter or resistance meter
• Delta low resistance test method, which can effffectively
compensate the measurement error caused by thermal electromotive
force.
