• 10.1-inch capacitive touch screen, resolution 1280*800, Linux
system
• Dual CPU architecture , the fastest test speed of 0.56ms (1800
times/second)
• Three test methods: spot test, list scan, and graphic scan
(option)
• Four parasitic parameters (Ciss, Coss, Crss, Rg) are measured and
displayed on the same screen
• Integrated design: LCR + high voltage source + channel switching
• Standard 2-channel test, which can test two devices or dual-chip
devices at the same time, the channel is the most Up to 6 channels
can be expanded,channel parameters are stored separately
• Fast charging, shortens capacitor charging time and enables fast
testing
• Fast turn-on test Conduction
• Automatic delay setting
• High Bias: VGS: 0 - ±40V, VDS: 0 - 200V/1500V
• 10 bin sorting
Brief Introduction
TH510 series semiconductor C-V characteristic analyzer is an
analysis instrument designed by Changzhou Tonghui for semiconductor
materials and components design and research.
TH510 series semiconductor C-V characteristic analyzer innovatively
adopts new generation technologies such as dual CPU architecture,
Linux underlying system, 10.1-inch capacitive touch screen, Chinese
and English operation interface, built-in instruction and help,
etc., It is suitable for fast and automatic integration and sorting
of production lines and can meet laboratory research and
development and analysis.
The design frequency of TH510 series semiconductor C-V
characteristic analyzer is 1kHz-2MHz, the VGS voltage can reach
±40V, and the VDS voltage can reach 200V/1500V, which is enough to
meet the CV characteristic test and analysis of semiconductor
components such as conventional diodes, triodes, MOS tubes and
IGBTs. Thanks to the 10.1-inch capacitive touch screen with a
resolution of 1280*800, TH510 series semiconductor C-V
characteristic analyzer can display four parameters on the same
screen, all settings, monitoring, sorting parameters, status,
etc.can be displayed on the same screen Display, avoiding the
tedious operation of frequent switching.
Application
• Semiconductor components/Power components
Parasitic capacitance test and C-V characteristic analysis of
diodes, triodes, MOSFETs, IGBTs, thyristors, integrated circuits,
optoelectronic chips, etc.
• Semiconductor material
Wafer dicing, C-V characteristic analysis
• Liquid crystal material
Elastic constant analysis
Notable Features
A.Single-spot test, 10.1-inch large screen, four parasitic
parameters are displayed on the same screen, so that the details
can be seen at a glance.
10.1-inch touch screen, 1280*800 resolution,Linux system, Chinese
and English operation interface, support keyboard, mouse, LAN
interface, which brings unparalleled operation convenience.
The four most important parasitic parameters of MOSFET: Ciss, Coss,
Crss, Rg directly display the measurement results on the same
interface, and display the equivalent circuit diagram of the four
parameters at the same time, which is clear at a glance.
Up to 6 channels of measurement parameters can be quickly recalled,
and the sorting results are directly displayed on the same
interface.
B.List scan, flflexible combination
TH510 series semiconductor C-V characteristic analyzer supports
testing and analysis of up to 6 channels and 4 measurement
parameters.
The list scan mode supports any combination of difffferent
channels, difffferent parameters, and difffferent measurement
conditions, and can set
the limit range and display the measurement results.
C.Graphic scan function (option)
TH510 series semiconductor C-V characteristic analyzer supports C-V
characteristic curve analysis, can realize curve scanning in
logarithmic and linear ways, and can display multiple curves at the
same time: multiple curves with the same parameter and different
Vg; multiple curves with the same Vg and difffferent parameters .
D.Simple and quick setup
The parameters can be selected arbitrarily and can be turned on and
offff. Turning offff the parameters can effffectively save time
and data transmission; the delay time can be set automatically or
by itself; the gate resistance can be selected from drain
source short-circuit or drain-source open circuit. Spot test
setting inferface
Using a graphical setting interface, the function parameters
correspond to the schematic settings at a glance
E.10 BINS sorting and programmable HANDLER interface
The instrument provides 10 grades of sorting, which provides the
possibility for customer product quality classification,and the
sorting results are directly output to the HANDLER interface.
When connecting with automation equipment, how to configure the
output of the HANDLER interface has always been a diffiffifficult
problem for automation customers. The TH510 series fully visualizes
the pin position of the HANDLER interface, input and output
methods, corresponding signals, and response methods, making
automatic connection easier.
F.Support customization, intelligent fifirmware upgrade
Tonghui Instrument is open to customers. All interfaces and
instruction sets of the instrument are open design. Customers
can program integration or customize functions by themselves. If
there is no hardware change in customized functions, they can
be updated directly through fifirmware upgrade.
The instrument itself has perfect functions, BUG solutions,
function upgrades, etc., can be updated by upgrading the fifirmware
(Firmware) without returning to the factory.
The fifirmware upgrade is very intelligent, which can be carried
out through the system setting interface or the fifile management
interface, intelligently search the instrument memory, external USB
flflash drive or even the upgrade package in the local area
network, and automatically upgrade.
G. Knowledge of parasitic capacitance of semiconductor components
In high-frequency circuits, the parasitic capacitance of
semiconductor devices often affffects the dynamic characteristics
of
semiconductors, so the following factors need to be considered when
designing semiconductor components.
In the design of high-frequency circuits, it is often necessary to
consider the inflfluence of the diode junction capacitance; the
parasitic capacitance of the MOS tube will affffect many aspects
such as the operation time, driving ability and switching loss of
the tube; the voltage dependence of the parasitic capacitance is
also in the circuit design. Crucially, take the MOSFET as an
example.
