Active Member
|
[China]
Address: High&New Technology Industrial Park, Yubei District, Chongqing, China
Contact name:Leeb Team
Chongqing Leeb Instrument Co.,Ltd |
|
|
Digital Superficial Rockwell Hardness Tester/ Durometer With Rockwell Scales: HR15N, HR30N, HR45N, HR15T, HR30T, HR45T
● Multi-function, Digital LCD Screen display
● Automatic loading & unloading, Electric load
● Easy operation, tiny indentation, high accuracy
● Superficial Rockwell Scales: HR15N,HR30N, HR45N, HR15T, HR30T, HR45T
● With printer for data output
● Easy for hardness scales conversion
● Shape correction settings for curved surfaces
● Meets or exceeds GB/T230.2, ISO 6508-2, ASTM E18 standards
Application:
● Industrial production, Inspection of product quality on processing technology.
● Ferrous and nonferrous metals, tempered steel, annealed steel, hardened steel, sheet of various thicknesses, carbide materials, powder metallurgy materials, hardness and thermal spray coating.
Technical Parameters:
| Model | LHRMS-45 |
| Conversion Scale | HRA,HRB,HRC,HRD,HRF,HV,HK,HR15N,HR30N,HR45N,HR15T,HR30T,HR45T |
| Indication of Hardness Value | Large LCD screen display |
| Data output | Inside Printer |
| Duration time | 0-60s |
| Carried Standard | GB/T230.2, ISO 6508-2, ASTM E18 |
| Preliminary Testing force | 3kgf(29.42N) |
| Testing force | 15kgf(147.1N)30kgf(294.2N)45kgf(441.3N) |
| Rockwell Scale | HR15N HR30N HR45N HR15T HR30T HR45T |
Hardness measuring range | HR15N:0-98, HR30N:0-97, HR45N:0-95 |
| HR15T:0-94, HR30T:0-84, HR45T:0-76 | |
| Max Height of Specimen | 190mm |
| Distance of Indenter to outer wall | 165mm |
| Power supply | AC220V+5%,50-60Hz |
| Overall Dimension (mm) | 520*240*720mm |
| Net weight | About 80Kg |
Standard Accessories:
| Name | Quantity | Name | Quantity |
| Diamond Rockwell Indenter | 1 | 1.5875mm Ball Indenter | 1 |
| Superficial Hardness block | 3 | Large, Medium, “V” shaped Testing Table | 1 each |
| Weights(A,B,C) | 1 each | Plastic Dustproof cover | 1 |
| Operation Manual | 1 | Product Certificate | 1 |
Picture:
