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Semi-Insulating , GaAs Wafer With Low Defect Density , 3”, Prime Grade

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XIAMEN POWERWAY ADVANCED MATERIAL CO., LTD.

Semi-Insulating , GaAs Wafer With Low Defect Density , 3”, Prime Grade

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Product Details

Semi-Insulating , GaAs Wafer With Low Defect Density , 3”, Prime Grade

 

PAM-XIAMEN develops and manufactures compound semiconductor substrates-gallium arsenide crystal and wafer.We has used advanced crystal growth technology,vertical gradient freeze(VGF) and GaAs wafer processing technology,established a production line from crystal growth, cutting, grinding to polishing processing and built a 100-class clean room for wafer cleaning and packaging. Our GaAs wafer include 2~6 inch ingot/wafers for LED,LD and Microelectronics applications. We are always dedicated to improve the quality of currently substates and develop large size substrates.

 

(GaAs)Gallium Arsenide Wafers,Semi-insulating for Microelectronics Applications

ItemSpecificationsRemarks
Conduction TypeInsulating 
Growth MethodVGF 
DopantUndoped 
Wafer Diamter3, inchIngot available
Crystal Orientation(100)+/- 0.5° 
OFEJ, US or notch 
Carrier Concentrationn/a 
Resistivity at RT>1E7 Ohm.cm 
Mobility>5000 cm2/V.sec 
Etch Pit Density<8000 /cm2 
Laser Markingupon request 
Surface FinishP/P 
Thickness350~675um 
Epitaxy ReadyYes 
PackageSingle wafer container or cassette

 

Properties of GaAs Crystal

PropertiesGaAs
Atoms/cm34.42 x 1022
Atomic Weight144.63
Breakdown Fieldapprox. 4 x 105
Crystal StructureZincblende
Density (g/cm3)5.32
Dielectric Constant13.1
Effective Density of States in the Conduction Band, Nc (cm-3)4.7 x 1017
Effective Density of States in the Valence Band, Nv (cm-3)7.0 x 1018
Electron Affinity (V)4.07
Energy Gap at 300K (eV)1.424
Intrinsic Carrier Concentration (cm-3)1.79 x 106
Intrinsic Debye Length (microns)2250
Intrinsic Resistivity (ohm-cm)108
Lattice Constant (angstroms)5.6533
Linear Coefficient of Thermal Expansion,6.86 x 10-6
ΔL/L/ΔT (1/deg C)
Melting Point (deg C)1238
Minority Carrier Lifetime (s)approx. 10-8
Mobility (Drift)8500
(cm2/V-s)
µn, electrons
Mobility (Drift)400
(cm2/V-s)
µp, holes
Optical Phonon Energy (eV)0.035
Phonon Mean Free Path (angstroms)58
Specific Heat0.35
(J/g-deg C)
Thermal Conductivity at 300 K0.46
(W/cm-degC)
Thermal Diffusivity (cm2/sec)0.24
Vapor Pressure (Pa)100 at 1050 deg C;
1 at 900 deg C

 

WavelengthIndex
(µm)
2.63.3239
2.83.3204
33.3169
3.23.3149
3.43.3129
3.63.3109
3.83.3089
43.3069
4.23.3057
4.43.3045
4.63.3034
4.83.3022
53.301
5.23.3001
5.43.2991
5.63.2982
5.83.2972
63.2963
6.23.2955
6.43.2947
6.63.2939
6.83.2931
73.2923
7.23.2914
7.43.2905
7.63.2896
7.83.2887
83.2878
8.23.2868
8.43.2859
8.63.2849
8.83.284
93.283
9.23.2818
9.43.2806
9.63.2794
9.83.2782
103.277
10.23.2761
10.43.2752
10.63.2743
10.83.2734
113.2725
11.23.2713
11.43.2701
11.63.269
11.83.2678
123.2666
12.23.2651
12.43.2635
12.63.262
12.83.2604
133.2589
13.23.2573
13.43.2557
13.63.2541

 

What is a GaAs Test Wafer?

Most GaAs test wafers are wafers which have fallen out of prime specifications. Test wafers may be used to run marathons, test equipment and for high-end R & D. They are often a cost-effective alternative to prime wafers.

 

What is the Basic Parameters at 300 K of GaAs Wafer?

 

Crystal structureZinc Blende
Group of symmetryTd2-F43m
Number of atoms in 1 cm34.42·1022
de Broglie electron wavelength240 A
Debye temperature360 K
Density5.32 g cm-3
Dielectric constant (static )12.9
Dielectric constant (high frequency)10.89
Effective electron mass me0.063mo
Effective hole masses mh0.51mo
Effective hole masses mlp0.082mo
Electron affinity4.07 eV
Lattice constant5.65325 A
Optical phonon energy0.035 eV

 

Are You Looking for GaAs Wafer?

PAM-XIAMEN is your go-to place for everything wafers, including GaAs wafers, as we have been doing it for almost 30 years! Enquire us today to learn more about the wafers that we offer and how we can help you with your next project. Our group team is looking forward to providing both quality products and excellent service for you!

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