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[China]
Trade Verify
Address: No.6-36, Yaogu Farm, Shibi No.3 Village, Shibi Street, Panyu District, Guangzhou, Guangdong, China
Contact name:Tessa Huang
HJ AUTOMATIC CONTROL TECHNOLOGY CO., LTD |
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Verified Suppliers
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Test Finger Probe Access Probes of IEC 60529 Jointed Test Finger With 50N Force
Standard:
IEC 60529 Degrees of protection provided by enclosures (IP Code) Figure 1 – Jointed test finger.
IEC 61032 Protection of persons and equipment by enclosures –Probes for verification Figure 2–Test probe B.
And other standard such as IEC 60335-1, IEC60884-1, IEC 60598-1, IEC60065-1, IEC 62368-1 and etc.
Application:
It is used to verify protection of persons against access to hazardous live parts or hazardous mechanical parts. Test Finger Probe
Parameter:
| Model | HT-I02 | HT-I02T |
| Name | Jointed test finger | Jointed test finger With Force |
| Joint 1 | 30±0.2 | 30±0.2 |
| Joint 2 | 60±0.2 | 60±0.2 |
| Finger length | 80±0.2 | 80±0.2 |
| Fingertip to baffle | 180±0.2 | 180±0.2 |
| Cylindrical | R2±0.05 | R2±0.05 |
| Spherical | R4±0.05 | R4±0.05 |
| Fingertip cutting bevel angle | 37o 0 -10′ | 37o 0 -10′ |
| Fingertip taper | 14 o 0 -10′ | 14 o 0 -10′ |
| Test finger diameter | Ф12 0 -0.05 | Ф12 0 -0.05 |
| A-A Section diameter | Ф50 | Ф50 |
| A-A Section width | 20±0.2 | 20±0.2 |
| Baffle diameter | Ф75±0.2 | Ф75±0.2 |
| Baffle thickness | 5±0.5 | 5±0.5 |
| Force | ---- Test Finger Probe | With force of 0-50N |
| Applied standard | IEC61032-1 | IEC60529-1 |
