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[China]
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Address: Building 5, TEDA Raycom Park, No.12 Zhu Yuan Road, Tianzhu Free Trade Zone Shunyi, 101312, Beijing, China
Contact name:Hu
SINO AGE DEVELOPMENT TECHNOLOGY, LTD. |
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HARTIP 3210 is a new generation of hardness tester with more advanced technology and features. The tester applies our new patent technology which makes the tester more accurate than old previous model. All impact device (probe) are no need to setup impact direction. HARTIP 3210can work with both analogy impact device and wireless RF probe.
The measuring values can be downloaded to PC and printer by
wireless or by cable.
The HARTIP3210 also can be powered by USB power supply without
battery via PC cable.
MEASURING METHOD
The measuring principle of HARTIP series hardness testers is defined as "the quotient of the impact body's rebound and impact velocity, multiplied by 1000." An impact body with a Tungsten Carbide test tip is propelled by spring force against the test surface and then rebounds back. A permanent magnet is contained within the impact body. When it passes through the coil on impact device, it induces an electric voltage which is proportional to the velocity of the impact body.
KEY FEATURES
Specifications
| Model | SADT HARTIP 3210 |
| Principle | Leeb hardness measurement |
| Accuracy | ±0.3% @ HL=800, Repeatability: ±2HL |
| Display | 2.8” 320 x 240 TFT color LCD - fittable under sunshine |
| Hardness scale | HL / HRC / HRB / HB / HV / HS / HRA /σb |
| Measuring range | HL100-960 / HRC0.9-83.2 / HRB1-140 / HB1-1878 / HV1-1698 / HS0.5-1370 / HRA1-88.5 / σb(rm)1-6599N/mm² |
| Probe | r/f wireless probe D / standard cable probe D DC / D+15 / C / G / E / DL (Optional) |
| Materials | 11 common metal materials, 60 conversion curves |
| Memory | 63 files, 100 data for each file, can be saved and re-readable |
| Statistics function | Single group analysis -- mean, max., min., extreme deviation, standard deviation, coefficient of kurtosis, coefficient of skewness, percent of pass, column diagram, normality distribution test and uniform distribution test Double group analysis-- significant difference test for mean value, standard deviation, percent of pass and distribution |
| Re-calibration | Calibration for unified or individual scale |
| Indicator | Upper limit / Lower limit / low battery / buzzer warning / date and time |
| Language | English, Simplified Chinese, Traditional Chinese, Russian, Korean, French, Italian, German, Turkish, Spanish |
| Communication | USB / RS232 / Bluetooth / 2.4G wireless(Optional) |
| Continous working time | >40 hours |
| Power supply | 1.5V AA alkaline battery x 4 / 1.2V nickel-hydrogen rechargerable battery x 4 / 3.7VLi-ion rechargeable battery x 4 / USB power supply |
| Working environment | -10~+45ºC |
| Dimension (mm) | 195x84x38 |
| Net weight (g) | 550 |
| Standards | Conforming to ASTM A956, DIN 50156, GB/T 17394-1998 |
Special Features of Impact Devices
| Type | Brief description | |
| D | Universal standard unit for majority of hardness testing assignments. | |
| DC | Extremely short impact device, other specs identical with type D. | |
| Application: | - highly confined spaces | |
| - holes and cylinders | ||
| - internal measurements on assembled machines | ||
| D+15 | Slim front section | |
| Application: | - grooves and recessed surfaces. | |
| DL | Extremely slim front section | |
| Application: | - extremely confined spaces | |
| - base of grooves | ||
| C | Reduced impact energy ( compared with type D). | |
| Application: | - surface hardened components, coatings | |
| - minimum layer thickness: 0.2mm. | ||
| - thin walled or impact sensitive components (small measuring indentation). | ||
| E | Synthetic diamond test tip (approx.5000 HV). | |
| Application: | - extremely high hardness measurement such as high carbon steel up to 1200 HV | |
| G | Increased impact energy(approx. 9 times that of type D) | |
| Application: | - Brinell hardness range only | |
| - heavy cast and forged parts with lower demands on surface finish. | ||
