|
Trade Verify
Address: 7th Floor, Chengyuan Building B, the Mid. Road of Jiancaicheng Haidian Dist.BeiJing,CHINA 100096
Contact name:JingAn Chen
HUATEC GROUP CORPORATION |
|
Verified Suppliers
|
|
|
Touch Screen TOFD Phased Array Rabar Phased Array Ultrasonic Phased Array Flaw Detector
Breif Introduction of HPA-500
HUATEC model HPA-500 is a portable phased array ultrasonic flaw detector newly developed by HUATEC GROUP. Being water&oil -proof and fan-free, with touch screen and whole-process data logging, it’s among the best of its kind for smart PA inspection. This product is applicable to: common or special welded seams of steel structures, utility boiler, pressure vessel, pipeline, nuclear power infrastructures, watercraft, oil tank, ethylene tube; railway welded seams, locomotive wheel sets and axles;aluminum alloy FSW butts and bondings of composites used in aerospace industry;blades and bolts used in power industry; cases when there’s not enough space for movement whilst inspection; cases when conventional UT is preferred.
Main tesing purpose includes:Corrosion imaging and composite material testing,TOFD welding inspection and Component testing, uses ultrasonic technology to detect cracks, wall thinning, and various other defects.
★ Files & Entry Management System for Flexible Bridging between setting (Focal Law & Model), Calibration and Inspection
★ Modular Configuration design, including: L-Scan, S-Scan, L-C-Scan, S-C-Scan, Butt-Weld, CrankShaft , Pipeline, TOFD, UT(Conventional)
★ 3D Simulation Model design
★ Image analysis function
★ Natural Structure of Heat Dissipation
★ Dynamic Depth Focusing (DDF) function
★ Smooth Filtering
★ Touch Screen for easy operation
★ ACG Calibration function
★ TCG Calibration function
II 3D Simulation Model
The 3D simulation scheme can be customized to offer one-for-all solutions.
III. APP Menu design
Menu of the software is shown in the manner of APP.
It can be cut down or enlarged accordingly if asked by the users
IV Metallic Housing
To strengthen the instrument, both shielding and heat-dissipating
V. Protective Pedestal
To prevent any damage to either the instrument or the object
Channel Configuration Option
| Mode | PA | UT | TOFD |
| Channel | 16:64 | 2 | 2 |
Physical Technical Specification
| Display screen | 11-inch 800X600 TFT color display |
Transducer Ports | 160-pin PA transducer port; Lemo-00 conventional transducer Port, for either T-R or T&R |
| I/O Ports | USB2.0 Port: 2(qty) |
| HDMI; encoder | |
| LAN(Gigabit-NIC); | |
| WIFI | |
| I/O (commissioning) | |
| 2D Encoder | |
| Memory data | In-Built: 16G RAM+4GB FLASH ;SD card (max to 32G); External: USB drive |
| Weight net | 3.5Kg (with 1 battery) |
| Dimension | 284mm×202mm×95mm |
| Power supply | AC:100～240V,50～60Hz；DC:12V |
| Charging way | (battery) within or individually |
| Battery life | 6 Hours continuously |
| Working power | 24W |
| Language | English |
Temperature Conditions | Ambiance:-20℃～50℃ Storage:-20℃～60℃ |
| IP Protection | IP54
|
Performance Specification
| Modes | PA mode | UT mode | TOFD mode |
| PRF | 50Hz～10kHz | 50Hz～5kHz | 50Hz～5kHz |
| Voltage V | Bipolar, ±45～±100V, with 5V per step | Negative Square Wave, -75V～-250V, with 25V per step | Negative Square Wave, -75V～-250V, with 25V per step |
| Pulse Width | 20ns～800ns, with 5ns per step | 20～800ns, with 5ns per step | 20～800ns, with 5ns per step |
| Damping | 50Ω | 80Ω / 400Ω | 80Ω / 400Ω |
| Sampling Rate | 125MHz | 200MHz | 200MHz |
| Delay Precision | 2.5ns | N/A | N/A |
| Rx Delay | 0～40us | N/A | N/A |
| Bandwidth | 0.5MHz～19MHz | 0.5MHz～15MHz | 0.5MHz～15MHz |
| Gain | 0.0～80dB | 0.0～110.0dB | 0.0～110.0dB |
| Filter | 0.5-9.6MHz,2.5-12.9MHz, 3.8-19MHz Optional | broadband, narrowband | broadband, narrowband |
| Rectification | FW | FW | RF |
| Reject | 0~80% | 0~80% | 0~80% |
| Scan Mode | A/L/S/C | A | A/D |
| Triggering | Encoder | N/A | Encoder |
| Scan Line | Max 128 | N/A | N/A |
| Skew | L-scan:-89°～+89° S-scan:-89°～+89° | N/A | N/A |
| Smart-Cal | Velocity/Delay/ACG/TCG/Encoder | DAC/DGS | Delay/X-Value/PCS/ Wave/Encoder |
| Testing Range | 0.0～1000mm, min 1mm | 0.0～2000mm | 0.0～2000mm |
Displaying Delay (max) | 1000mm | 2000mm | 2000mm |
Pulse Shift (max) | N/A | 2000mm | 2000mm |
| Unit | mm | mm | mm |
| Gate | A/B | A/B | A/B |
| Gate Start | Available within the range | Available within the range | Available within the range |
| Gate Width | Available within the range | Available within the range | Available within the range |
| Gate Threshold | 0-100% | 5-95% | 0-100% |
| Alarm Signal | Buzzer / LED | Buzzer / LED | Buzzer / LED |
| Spotting | Crest / Flank | Crest / Flank | Crest / Flank |
| Readout | Amp/Path/ Horizontal/Depth | Amp/Path /Horizontal/Depth | Amp/Path /Horizontal/Depth |
| Resolution | 0.5mm | 0.1mm | 0.1mm |
Application for phased array UT HPA-500
HPA-500 1pc
PAUT Probe 1pc
PAUT Probe Wedge 2pcs
UT Normal Probe 2.5P20 1pc
UT Angle Probe 2.5P13×13 60°1pc
UT Probe Cable LEMO 00-BNC 2pcs
Li-ion battery 1pc
Charger 1pc
Power converter 1pc
HDMI Cable 1pc
Crossover Cable 1pc
Allen Wrench (S2.5) 1pc
Instrument Suitcase 1pc
USB Drive Disk (8G) 1pc
User Manual 1pc
Certificate 1pc
TOFD Probe 5MHz 6mm/7.5MHz 3mm/
TOFD Wedge 60°w/anti-wear nail , 70°w/anti-wear nail
TOFD Wedge R100 curve surface R100/0°
TOFD Probe Cable LEMO 00-LEMO 00
Non-Parallel TOFD Scanner
Scanner for Phased Array
Encoder Cable Extension
Other Allen Wrench for TOFD
Other probes/wedge for Phased Array and TOFD
Straight probe
(5MHZ-ф20)
Straight probe
(2.5MHZ-ф20)
Straight probe
(2.25MHZ-ф20)
Straight probe
(1MHZ-ф20)
Angle probe (4MHZ-45degree,
8*9mm)
Angle probe (4MHZ-60degree,
8*9mm)
Angle probe (4MHZ-70degree,
8*9mm)
Angle probe (4MHZ-80degree,
8*9mm)
Angle probe (2MHZ-45degree,
8*9mm)
Angle probe (2MHZ-60degree,
8*9mm)
Angle probe (2MHZ-70degree,
8*9mm)
Angle probe (2MHZ-80degree,
8*9mm)
Probe T/R (5MHz-ф20mm, focus
15mm)
Probe T/R (2.5MHz-ф20mm, focus
15mm)
Connection cable to probe
(BNC-BNC)
Connection cable to probe (BNC-Lemo
00)
Connection cable to probe (Lemo
01-BNC)
Connection cable to probe (Lemo 01-Lemo
00)
Test block IIW V1,V2,PAUT, PA-A, PA-B
Test block TOFD
Test blocks DAC, ASME etc.
