crystal vibration test machine for electronic component tester

crystal vibration test machine for electronic component tester

Main feature
1 It's using reciprocal counting technique, high accuracy, wide measuring range, truly equal precision measurement, fast speed measurement,high sensitivity.
2 single-chip microprocessor technology cycle frequency measurement and intelligent management, making the instrument has high reliability and excellent performance / price ratio.
3 It's using LSI design, the use of CPLD devices, instrument components greatly reduced, reliability has been greatly improved, the average time between failures ≥10000h.
The machine looks nice, small size, light weight, easy to use.

Measuring range
Frequency Measurement:A Channel:1Hz ~ 100MHz;
B channel: 100MHz ~ 1.6GHz (optional)
Period Measurement: A Channel: 10ns ~ 1s
PPM measurement: -9999 ~ 9999ppm
Upper and lower limit measurement: according to the parameters set by the user of upper limit F_U, lower limit F_Lparameters to measure the measured frequency whether exceeds the lower limit and upper limit value. if exceed, it will be alarm.

Binning measurement: according to the center frequency F₀set by the user, automatically binned measurements.

Binning value: Pr1 ~ Pr8 can be set between 1 ~ 999ppm
quantity of Binning: according to center frequency F₀is divided into 16 stalls around the midpoint

Cumulative count: Counting Capacity: 0 ~ 10₉-1 (optional)
Counting mode: Keying, gating or external gating for optional
Input characteristics
Input impedance: A Channel: 1MΩ // 40pF
B Channel: 50Ω

Input Coupling: AC
adaptive waveform: sine, pulse wave
Input voltage dynamic range:
A Channel: 30mVrms ~ 250Vp ~ p
B channel: 30mVrms ~ 1Vrms

A channel low-pass filter: -3dB bandwidth approximately is 100kHz
A ChannelAttenuation: × 1 or × 20

Measurement error
The frequency or period measurement error: ± time base error ± trigger error ± LSD 100ns
When: LSD = _× measured frequency (or test period)
Gate time

Trigger error: When the measured signal to noise is 40dB, the trigger error is ≤0.3%
PPM measurement error: ± time base error ± trigger error ± LSD
When: LSD = (100ns / gate time) ×10⁶ppm
For example: When the gate time = 1s,LSD = 0.1ppm
When the gate time = 0.1s,LSD = 1ppm
counting error: ± 1

gate time
Fixed gate: 10ms, 100ms, 1s, 10s four types optional
Adjustable Gate: 50ms ~ 95ms in 10 files, each file interval of 5ms.
Crystal Oscillator
Nominal frequency: 10MHz
Frequency stability: 5 × 10^-6/ d
(According to user needs, you can match higher crystal)
Such as: 1 × 10^-6/ d, 5 × 10^-7/ d, 1 × 10^-7/ d, etc.).
FSB standard input
Input frequency: 10MHz
Input amplitude:> 1Vp ~ p sine wave
Display
13 digits 0.4-inch bright LED green, three units of LEDIndicator light(MHz, kHz, Hz), GATE indicator, EXT indicator and PPM indicator
Power
Voltage: AC 220V ± 10%
Frequency: 50Hz ± 5%
Power consumption: <8VA
Dimensions: 230 × 250 × 90 (mm)

Weight: <1.5kg
Crystal test kit (crystal measuring matcher) Optional:
1Hz-20MHz (comes with machine)
20MHz-40MHz (sold separately),
40MHz-65MHz (sold separately);
65MHz-100MHz (sold separately).