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Metallographical Sample Abrasive Manual Cutting Machine with Rotation 2800rpm

DongGuan Q1-Test Equipment Co., Ltd.
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Address: No. 88, Jiaolian Yiheng Road, Wanjiang district, DongGuan, China (523046)

Contact name:Andy DAI

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DongGuan Q1-Test Equipment Co., Ltd.

Metallographical Sample Abrasive Manual Cutting Machine with Rotation 2800rpm

Country/Region china
City & Province dongguan guangdong
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Product Details

 

Metallographic Cutting Machine Sample Abrasive Cutting Machine Cut Diameter 100mm

 

Brief Introduction:

iCut-408 multifunctional cutting machine mainly used to cut irregular metallographic samples such as round cylinder, polygon, protruding platforms, etc.

 

It adopts double-shells totally closed structure and double quick clamp organization to guarantee cutting under absolutely safe status. Feed speed is controllable.

 

In order to avoid sample organization burns during cutting, the machine is furnished with strong cooling system, can avoid even little burn of the sample surface while cutting.

 

Technical Specifications:

Cutting Section100mm x 100mm
Rotation Speed2800rpm
Cutting Wheel350 x 2.5 x 32mm
Motor4Kw, AC380V/50Hz/3Ph
Dimension850 x 760 x 1400mm
Net Weight350Kg

 

What is Specimen Cutting:

When cutting a specimen from a larger piece of material, care must be taken to ensure that it is representative of the features found in the larger sample, or that it contains all the information required to investigate a feature of interest.

 

One problem is that preparation of the specimen may change the microstructure of the material, for example through heating, chemical attack, or mechanical damage. The amount of damage depends on the method by which the specimen is cut and the material itself.

 

Cutting with abrasives may cause a high amount of damage, while the use of a low-speed diamond saw can lessen the problems. There are many different cutting methods, although some are used only for specific specimen types. iqualitrol provides the iCut-864 low speed diamond saw for cutting OM (optical microscope), SEM (scanning electron microscope), and even TEM (transmission electron microscope) specimen.

 

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