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1.2/50 μs Transient Voltages Test Generator Electrical Appliance Testing Equipment

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1.2/50 μs Transient Voltages Test Generator Electrical Appliance Testing Equipment

Country/Region china
City & Province guangzhou guangdong
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Product Details

 

IEC 60335-1 12.5kV 1.2/50 μs Transient Voltages Test Generator

 

Product information:

 

This impulse voltage test generator is required by IEC60335-1 clause 14, IEC60065:2014 clause 10.2, 13.3.4 a), and IEC 60065:2014 clause 13.3.4 b), 14.2, IEC60950, and etc.

It is used to detect the transient over voltage of the components and the electrical clearance and the creepage distance of household appliance, Audio, video and similar electronic apparatus.

This impulse voltage test generator is a standard lightning wave test device with waveform 1.2/50µs. Wavefront time is 1.2µs, wave after time is 50µs, it is a destructive tester. The sample breakdown will produce a spark and acoustic, instrument peak voltage than the no-load voltage is decreased substantially (close to zero), when applying the same voltage in the next test, it will also show the above phenomenon.

 

Technical Parameters:

 

ModelSN1104
DC high voltageMax. 12.5kV
Impulse voltage wave

Impulse wavefront time: 1.2 µs ± 30 %;

Half value of after wave time: 50 µs ± 20 %

Instrument internal resistance

12Ω ± 10%

Internal resistance converter box500Ω - 10% optional
Peak voltage: 300 V~ 12,500V

0-12500V

Low: 300 V~ 2,500V; High: 2,500 V~ 12,500V

Impact interval time5 ~ 99s
Impact cycles1 ~ 9999
PolarityPositive and negative
Working power sourceMatch client's local power supply grid
Dimension630mm×600mm×380mm
Weight30 KG
 
Circuit principle:
Output waveform definition
Voltage wave

Impulse wavefront time: T1=1.67T=1.2 µs ± 30 %;

Half value of after wave time: T2=50 µs ± 20 %

 

Note: the waveform will be shown by an external oscilloscope (oscilloscope should be prepared by user)
 
Sample connection:
 
As shown in the picture below, connect the red and black wires of the junction box to the equipment respectively, and connect the positive and negative poles of the sample to the terminals of the junction box.
 
 

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