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Address: Building 5, TEDA Raycom Park, No.12 Zhu Yuan Road, Tianzhu Free Trade Zone Shunyi, 101312, Beijing, China
Contact name:Hu
SINO AGE DEVELOPMENT TECHNOLOGY, LTD. |
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Verified Suppliers
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Impact device/Probe for IMPACT DEVICE
Leeb hardness tester
Various impact devices includes analog impact device, digital impact device, wireless impact device, universal impact device and unique reading probe, they are designed for Leeb hardness testers, which make the testers suitable for testing the hardness of all metals. They are widely used in the industry of power, petro chemistry, air space, vehicle, machine and so on.
Specifications
| Impact Device (Probe) | Description |
| D | Universal standard unit for majority of hardness testing assignments. |
| DC | Extremely short impact device, other specs identical with type D. |
| Application: | Highly confined spaces. |
| Holes and cylinders. | |
| Internal measurements on assembled machines | |
| D+15 | Slim front section |
| Application: | Grooves and recessed surfaces |
| DL | Extremely slim front section. |
| Application: | Extremely confined spaces |
| Base of grooves | |
| C | Reduced impact energy (compared with type D) |
Application:
| Surface hardened components, coatings |
| Minimum layer thickness: 0.2mm | |
| Thin walled or impact sensitive components (small measuring indentation) | |
| E | Synthetic diamond test tip (approx.5000 HV) |
| Application: | Extremely high hardness measurement such as high carbon steel up to 1200 HV |
| G | Enlarged test tip, increased impact energy(approx. 9 times that of type D) |
| Application: | Brinell hardness range only |
| Heavy cast and forged parts with lower demands on surface finish |
IMPACT DEVICE
Analog impact device with cable
Impact Device D
Impact Device DC
Impact Device D+15
Impact Device DL
Impact Device C
Impact Device E
Impact Device G
Universal impact device with cable
Impact Device D
Impact Device DC
Impact Device D+15
Impact Device DL
Impact Device C
Impact Device E
Impact Device G
Digital impact device with cable
Impact Device D
Wireless impact device
Impact Device D
Impact Device DC
Impact Device D+15
Impact Device DL
Impact Device C
Reading impact device
RP Reading Probe
Sino Age Development Technology, Ltd. (SADT), established in 1993, is a leading manufacturer for measuring and testing instrument, specialized in NDT and quality control fields. We have our own HARTIP series portable hardness testers since 1995. We are professional producer with ISO 9001 quality system. Most of the products are applied with CE certificate.
Now our main products cover hardness tester, ultrasonic thickness gauge, concrete test hammer, gloss meter, colorimeter, roughness tester, metallurgical microscope, ultrasonic flaw detector and so on. We have exported our products in batch quantity to overseas market since 1996. Our main overseas markets are: USA, Canada, Germany, France, Netherlands, Finland, Italy, Czech Republic, Poland, Lithuania, Estonia, Serbia, Russia, Greece, Turkey, Australia, New Zealand, Korea, Taiwan, Singapore, Thailand, Indonesia, Malaysia, Vietnam, India, Pakistan, Iran, UAE, Egypt, South Africa, Mexico and Columbia, Peru and etc. All products supplied by SADT have excellent quality and competitive price with our best service.
