Home Companies SINO AGE DEVELOPMENT TECHNOLOGY, LTD.

Impact Device / Probe Portable Hardness Tester Leeb Hardness Tester

SINO AGE DEVELOPMENT TECHNOLOGY, LTD.
Active Member

Contact Us

[China] country

Address: Building 5, TEDA Raycom Park, No.12 Zhu Yuan Road, Tianzhu Free Trade Zone Shunyi, 101312, Beijing, China

Contact name:Hu

Inquir Now

SINO AGE DEVELOPMENT TECHNOLOGY, LTD.

Impact Device / Probe Portable Hardness Tester Leeb Hardness Tester

Country/Region china
City & Province beijing beijing
Categories Switching Power Supply
InquireNow

Product Details

Impact device/Probe for IMPACT DEVICE Leeb hardness tester
 
Various impact devices includes analog impact device, digital impact device, wireless impact device, universal impact device and unique reading probe, they are designed for Leeb hardness testers, which make the testers suitable for testing the hardness of all metals. They are widely used in the industry of power, petro chemistry, air space, vehicle, machine and so on.
 
IMPACT DEVICE
 
Analog impact device with cable
Impact Device D
Impact Device DC
Impact Device D+15
Impact Device DL
Impact Device C
Impact Device E
Impact Device G

Universal impact device with cable
Impact Device D
Impact Device DC
Impact Device D+15
Impact Device DL
Impact Device C
Impact Device E
Impact Device G

Digital impact device with cable
Impact Device D
Wireless impact device
Impact Device D
Impact Device DC
Impact Device D+15
Impact Device DL
Impact Device C

Reading impact device
RP Reading Probe
 
Specification
 
 

Impact Device (Probe)Description
DUniversal standard unit for majority of hardness testing assignments.
DCExtremely short impact device, other specs identical with type D.
Application:Highly confined spaces.
Holes and cylinders.
Internal measurements on assembled machines
D+15Slim front section
Application:Grooves and recessed surfaces
DLExtremely slim front section.
Application:Extremely confined spaces
Base of grooves
CReduced impact energy ( compared with type D)
Application:Surface hardened components, coatings
Minimum layer thickness: 0.2mm
Thin walled or impact sensitive components (small measuring indenta­tion)
ESynthetic diamond test tip (approx.5000 HV)
Application:Extremely high hardness measurement such as high carbon steel up to 1200 HV
GEnlarged test tip, increased impact energy(approx. 9 times that of type D)
Application:Brinell hardness range only
Heavy cast and forged parts with lower demands on surface finish

 
 

 

_01_02

_04_05_06_07_08

 





































Hot Products

SADT HARTIP3210 Digital Portable Hardness Tester with Analogy cable probe and Wireless RF Probe ± ...
Light Weight Leeb Metal Portable Hardness Tester , ASTM A956 Standard HARTIP 3000 is an advanced ...
Portable Leeb Hardness Tester wholesales with color LCD(HARTIP3210) with wireless probe Product ...
HARTIP2000 of 2 in 1 probe portable hardness tester HARTIP2000 of 2 in 1 probe portable hardness ...
HARTIP3210 of High precision portable hardness tester HARTIP3210 of High precision portable hardness ...
Portable Hardness Tester HARTIP 2500 with big color display HARTIP 2500 is an innovation of ...