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Frequency Conversion Climate Test Cabinet Corresponding Test IS C60068-2-1 AC220V

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Frequency Conversion Climate Test Cabinet Corresponding Test IS C60068-2-1 AC220V

Country/Region china
City & Province dongguan guangdong
Categories Polishers
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Product Details

Frequency Conversion Climate Test Cabinet Corresponding test method IS C60068-2-1 Temperature range -70°C ~ 150°C

Temperature And Humidity Test Chamber Equipment summary:The machine is applied to test the materials in heat-resistance, cold-resistance, dry-resistance, moisture-resistance. It is simple to operate and program easy to edit. It can show the set values and operative time.

 

Temperature And Humidity Test Chamber technical parameter

Model(HZ-2004A)80-1000 Frequency Conversion Climate Test Cabinet
Temperature range-70 degree ~ +100(150) degree
Humidity range20%~98%R.H.
Accuracy/ uniformly±0.1 degree ±0.1%R.H./ ±1.0 degree ±3.0%R.H.
Accuracy / volatility±1.0 degree ±2.0%R.H. / ±0.5 degree ±2.0%R.H.
Heating / cooling time

About 4.0/min(heat),about 1.0/min(cool) ( 5~10/mm is

the specific condition )

Inside materialStainless steel SUS 304 #
Insulation materialHigh-temperature high-density amino acid ethyl ester foam insulation materials,
Cooling system

Air-cooled/ single-stage compressor(-20 degree) , wind,

water cooled/two-stage compressor(-40~-70 degree)

Protection

compressor overload switch, high and low pressure protection switch,

over-humidity-temperature protection switches, fuses, warning system

Accessories

recorder(purchase), view window, 50mm testing hole, PL lamp,

clapboard, Dry and wet gauze ball

 

Temperature And Humidity Test Chamber Applicable industries:

Applied to control the product quality, such as electronic, plastic products, electrical appliances, instruments, food, vehicles, metals, chemicals, building materials, aerospace, medical care and so on.

 

1. International Electrotechnical Commission Standard:

IEC68-2-03_test method Ca_Steady damp-heat

IEC68-2-01_test method A_cold

IEC68-2-02_test method B_dry heat

2. USA Semiconductor Industry Standard:

JESD22-A101-B-2004 Constant temperature and humidity test

JESD22-A103-C-2004 High Temperature Storage Test

JESD22-A119-2004 Low Temperature Storage Test

 

3. Japanese Industrial Standard:

JIS C60068-2-3-1987 test method Ca: Steady damp-heat

JIS C60068-2-2-1995 test method B:dry heat

JIS C60068-2-1-1995 test method A:low temperature

 

 

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