IEC 62368-1 Figure V.3 Test Finger Probe Telecom Test Probe With IEC60950 Figure 2C

IEC 62368-1 Figure V.3 Test Finger Probe Telecom Test Probe With IEC60950 Figure 2C

Standard description(IEC 62151 4.2.2.1):

4.2.2.1 Accessibility
The equipment shall be so constructed that in USER ACCESS AREAS there is adequate protection against contact with bare parts of TNV - 1 , TNV - 2 and
TNV - 3 CIRCUITS except that access is permitted to:                                                 Test Finger Probe
– contacts of connectors which cannot be touched by the test probe (figure 3);
– bare conductive parts in the interior of a battery compartment that complies with 4.2.2.2;
– bare conductive parts of TNV - 1
CIRCUITS that are connected to a PROTECTIVE EARTHING terminal;
In SERVICE ACCESS AREAS , no requirement is specified regarding access to TNV - 1 , TNV - 2 or TNV - 3 CIRCUITS , however HAZARDOUS - LIVE - PARTS shall be located or guarded so that unintentional bridging by conductive materials that might be present is unlikely.                   Test Finger Probe
Any guards required for compliance with 4.2.2.1 shall be easily removable and replaceable if removal is necessary for service.
In RESTRICTED ACCESS LOCATIONS no requirement is specified egarding access to TNV - 1 , TNV - 2 or TNV - 3 CIRCUITS .
However, HAZARDOUS - LIVE - PARTS shall be located or guarded so that accidental shorting to TNV CIRCUITS , for example by TOOLS or test probes used by SERVICE PERSONNEL , is unlikely. Any guards required for ompliance with 4.2.2.1 shall be easily removable and replaceable if removal is necessary for service.                 Test Finger Probe
Compliance is checked by inspection, by measurement and by means of the test finger (IEC 61032, test probe B) applied as specified in the compliance section of the relevant equipment standard), and the test probe, figure 3.

Standard:IEC 62368-1:2018 clause 5.3.2 and Figure V.3, IEC60950 figure 2C, IEC60065:2014 Annex B, Test Probe. According IEC 62151 Figure 3 and UL6500 figure B.1.

Application:It is used for the bare parts of TNV circuits of information technology equipment to see whether they have sufficient protection.

Test sample:Information technology equipment.

Feature:Nylon handle + stainless steel probe.

Parameters:

Picture for reference: