Home Companies HUATEC GROUP CORPORATION

Duplex Stainless Steel 2205 Iso 19675 Paut Calibration Block

Contact Us

Trade Verify

Address: 7th Floor, Chengyuan Building B, the Mid. Road of Jiancaicheng Haidian Dist.BeiJing,CHINA 100096

Contact name:JingAn Chen

HUATEC GROUP CORPORATION

Verified Suppliers

Trust
Seal
Verified
Supplier
Credit
Check
Capability
Assessment

Duplex Stainless Steel 2205 Iso 19675 Paut Calibration Block

City & Province	beijing beijing

Product Details

Duplex Stainless Steel 2205 ISO19675 PAUT Phased Array Ultrasonic Calibration Blocks

ISO19675:2017 specifies the requirements for the dimensions, material and manufactures of a steel block for calibrating ultrasonic test equipment used in ultrasonic testing with phased array technology.

Material: carbon steel 1018, stainless steel 304/316, duplex stainless steel 2205,aluminum 6063/7075,nodular cast iron and other materials.

Mark: HUATEC and OEM can be done

The basic verification of PAUT: material velocity verification, wedge delay verification and Angle correction gain verification

Other requirements of the test block:

It needs to be lightweight, cost-effective and meet the requirements of international regulations;

Can check the phased array probe according to other ISO standards;

Buyers can quickly and simply check and confirm that the ultrasonic characteristics of test blocks meet the requirements.

Two appendices were included in ISO 19675 to enable operators to quickly understand the appropriate use of the new PAUT test block.

Appendix A is A normative appendix that describes the measurement method of material anisotropy and instructs the test block maker how to determine the speed of sound (these values are required to be included in the technical documentation provided with the test block to the user for verification and acceptance by the operator).

Appendix B is a reference appendix. The purpose is to compare PAUT test blocks with ISO2400 test blocks (i.e., to compare old and new IIW test blocks), and to briefly explain some other possible uses, such as PA probe wedge delay assessment, petal assessment, active array element assessment, sensitivity equalization, data mapping verification, phased array element configuration, etc.