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CWDM Module Scanning And Spot Measurement Integrated System

Guangzhou UC Instruments., Co. Ltd.

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Address: R102, #24 Huangcun East Road,Tianhe District, Guangzhou 510660

Contact name:Jack Zhou

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Guangzhou UC Instruments., Co. Ltd.

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CWDM Module Scanning And Spot Measurement Integrated System

Country/Region china
City & Province guangzhou
Categories Other Consumer Electronics
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Product Details

CWDM Module Scanning And Spot Measurement Integrated System

 

System overview:

   The system is a comprehensive test system designed for CWDM, MWDM, LWDM and other multi-channel full-wave products. The system integrates the traditional ASE+OSA scanning mode and the point measurement mode of the point light source plus power meter, effectively improving the overall test efficiency of the product and reducing the equipment input cost and labor cost. In addition, the use of optical box to compress the station equipment space, improve the cleanliness of the station. In the testing process, the system is automated and processed, which is conducive to staff training and anti-stay and anti-error.

 

 

Working principle:

   Configure ASE (SLED), OSA, point light source and polarization controller according to the product type to be tested, and set the test specifications of the corresponding product. During operation, each station is independently completed for the point measurement parameters

For scanning parameters, the instrument server controls OSA according to the mechanism of FIFO according to the request of each client to scan. After all parameters are tested, the system divides the test data Analyze, save and determine automatically, and display the test results on the test program interface.

 

Highlight introduction:

1. Improve test efficiency: the product only needs to be connected once, reduce the number of wiring, automatic parameter testing;

2. Reduce testing costs: reduce staff training time, reduce equipment and personnel input;

3. Convenient on-site management: standard integrated optical path box, less space, simple optical path connection;

4. System error prevention: the operator works according to the prompt, the operation items are less, the system automatically determines and calculates;

5. Test parameters comprehensive: including IL, RL, PDL, ISO,.cwl, BW, Ripple WDM indexes such as;

6. Classification of test results: Define multiple product levels according to the actual needs of production;

7. Test data traceability: Data is retained in the database and local, and records can be traced for a long time;

8. Combined with FIS/MES system: paperless in the true sense can be achieved.

 

 

Test principle:

 

 

 

 

 

 

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