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[China]
Trade Verify
Address: RM C, 13/F, HARVARD COMMERCIAL BUILDING, 105-111 THOMSON ROAD, WAN CHAI, HK
Contact name:Lynette Wong
KingPo Technology Development Limited |
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Verified Suppliers
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Jointed test probe for equipment not likely to be accessible to children
Reference Standard:
IEC62368-1-Figure V.2
Specification:
Knurled Finger Diameter:12mm
Knurled Finger Length:80mm
Baffle Plate Diameter:50mm
Baffle Plate Length:100mm
Baffle Thickness:20mm
Tolerances on dimensions without specific tolerances:
– 14° and 37° angles: ± 15 ′
– on radii: ± 0,1 mm
– on linear dimensions:
≤ 15 mm: 0 ,-0.1 mm
> 15 mm ≤ 25 mm: ± 0,1 mm
> 25 mm: ± 0,3 mm
NOTE This jointed test probe is taken from Figure 2, test probe B
of IEC 61032:1997.
