ASTM ISO EN Ultraviolet Aging Tester Electronic Textile Testing

ASTM ISO EN Ultraviolet Aging Tester Electronic Textile Testing

Description

The most widely practical weather resistance test machine, Simulated the sunlight,rain,dew damage

on to the materials.These damages include: bleaching, discoloration, loss of light, powder, crack,

turbidity, bubble-based, embrittlement, strength decline and oxidation

Specifications:

Testing room size: 450*1170*500 mm (D*W*H)　

Outside dimension: 1370mm*1350mm*530mm(L*W*H)

Centre distance between the lamp: 70mm

Wavelength range: UV-A 315~400nm

Irradiance: 1.1W／m2／340nm(adjustable)

Temperature resolution: 0.1℃

temperature range of light: 50℃~70℃／tol.±3℃

condensation temperature range: 40℃~60℃／tol. ±3℃

black panel thermometer measurement range: 30~80℃／tol. ±1℃

temperature control method: PID Automatic constant temperature control way

Humidity range: 45%~70%R.H

Sink requirements:

The depth of the water is not more than 25mm, And has the automatic controller of water supply

Standard specimen size: 75*150mm or 75*300mm (if special size noted in contract)

Suggestion Environmental: 5~35℃,40%~85%R·H, The distance to the wall 300mm

Standard:

ASTM D4329,D499,D4587,D5208,G154,G53；ISO 4892-3,ISO 11507；EN534；EN 1062-4,BS 2782；JIS D0205；SAE J2020,GB/T14522-93

Service and Support
      Our company focuses on research and development , we were produced some intelligent testing equipments over thirteen years, we continue to provide stable performance, high-quality equipment for product quality testing industry.At present, the company has 14 utility model patent technologies,2 patents for invention and participated in the drafting and formulation of nine national standards.
      In cooperation we has a variety of testing units, industries, association partners and friends, accumulated a large number of detection industry insights and contacts, for those friends who just come into testing industry, we can learn from each other to communicate, explore the problems and difficulties encountered in testing.