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Environmental Scanning Electron Microscope / Sem Electron Microscope EM6900 Std

KYKY TECHNOLOGY CO., LTD.
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Address: No. 13 Zhongguancun Bei er tiao, Haidian District, Beijing,100190

Contact name:Wang Chao

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KYKY TECHNOLOGY CO., LTD.

Environmental Scanning Electron Microscope / Sem Electron Microscope EM6900 Std

Country/Region china
City & Province beijing beijing
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Product Details

SEM , EM6900 Std , tungsten filament , SE+BSE , Resolution 3nm@30KV(SE)

As KYKY over 60 years SEM manufacture experience, the whole EM series supports old system refurbished and customized system as SEM+, such as Electron Beam Lithography remodel, LaB6 upgrade,integrated with STM,AFM,Heating Stage;Cryo Stage;Tensile Stage;Micro-nano manipulator etc. System also has multiple interface at chamber for attaching most of the analysis detector in the market

 

Standard EM6900 with maximum resolution you could get from tungsten filament SEM and also has the most convenient detector bundling SE+BSE, comparing with EM6200 it has upgraded sample stage,upgraded objective also the vacuum pathways optimization which is friendly to the customer who’s willing to do the extension analysis based on the tungsten filament SEM.

 

Muti-language operation system,integrated control panel, customer could control the whole unit simply with mouse and keyboard,comprehensive after-sales service plan with lifelong technical support.

 

 

Advanteges:

◆ High resolution

◆ Upgradeable LaB6,huge sample stage etc

◆ Multiple modification schemes

◆ Full set of automated software

◆ Low maintainance cost

 

Specifications:

ItemEM6900 Std Tungsten Filament SEM
Resolution3nm@30KV(SE) 6nm@30KV(BSE)
MagnificationNegative Magnification:6X~300000X Screen Magnification:12X~600000X
Electron GunTungsten Heated Cathode-Pre Centered Tungsten Filament Cartridge
Accelerating Voltage0 ~ 30KV
Lens SystemThree-level electromagnetic lens(Tapered lens)
Objective ApertureMolybdenum aperture adjustable outside vacuum system
Specimen StageFive axes stage
TravelX(Auto)0 ~ 80mm
RangeY(Auto)0 ~ 60mm
 Z(Manual)0 ~ 50mm
 R(Manual)360°
 T(Manual)-5° ~ 90°
Max Specimen Diameter175mm
DetectorHigh vacuum secondary electron detector
Semiconductor four segmentation back scattering detector
IR CCD
 
ModificationStage Upgrade;EBL; STM; AFM; Heating Stage; Cryo Stage; Tensile Stage ; Micro-nano manipulator; SEM+Coating Machine;SEM+Laser
AccessoriesLaB6,X-Ray Detector(EDS),EBSD,CL,WDS,Coating Machine
Vacuum SystemTurbo Molecular Pumps;Rotation Pump

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