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IEC60950-1 Test Pin For Information Technology Equipment Test , Tip Diameter 3mm
IEC60950-1 clause 2.1.1.1 Access to energized parts
c) A test with the test pin, Figure 2B, which shall not contact bare parts at HAZARDOUS VOLTAGES when applied to openings in an external ELECTRICAL ENCLOSURE . Parts that can be detached by an OPERATOR , including fuseholders and lamps, are left in place, and OPERATOR access doors and covers are closed during this test. Test Finger Probe
The test finger, the test pin and the test probe are applied as
above, without appreciable force, in every possible position,
except that floor-standing equipment having a mass exceeding 40 kg
is not tilted.
Equipment intended for building-in or rack-mounting, or for
incorporation in larger equipment, is tested with access to the
equipment limited according to the method of mounting detailed in
the installation instructions.
Test Finger Probe
Where contact between the test tool and the part is not permitted
in the above tests, there is no requirement for a minimum air gap
for voltages not exceeding 1 000 V a.c. or 1 500 V d.c.
For higher voltages, there shall be an air gap between the part at
HAZARDOUS VOLTAGE and the test finger, Figure 2A, or the test pin,
Figure 2B, placed in its most unfavourable position. This air gap,
see Figure 2D
Standard:
Conforms to IEC 60065 clause 9.1.1.2, IEC61032 figure 9 Test probe13, IEC60950-1 figure 2B, IEC60335. Test Finger Probe
Application:
This pin is intended to verify the protection against access to hazardous live parts in class 0 equipment and class II equipment.
Test sample:
Easily accessible enclosure live parts or mechanical parts. Test Finger Probe
Feature:
It can be used for enclosure protection test when open threaded hole of M6 at the end of the handle (connected with pull and push dynamometer).
Parameters:
| Model/ Parameter | HT-I09 |
| Item Name | Short test pin probe |
| Metal pin tip diameter | Ф3 (0, -0.05) |
| Metal pin tail diameter | Ф4 (0, -0.05) |
| Metal pin length | 15 (0, -0.1) |
| Baffle diameter | Ф25±0.2 Test Finger Probe |
| Baffle thickness | 4 |
| Handle diameter | Ф10 |
| Handle length | 20 |
Picture for reference:
