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400-700nm 45/0 Grating Spectrometer For Printing Plants Process Control

Beijing HiYi Technology Co., Ltd

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400-700nm 45/0 Grating Spectrometer For Printing Plants Process Control

City & Province beijing beijing
Categories Refractory
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Product Details

YD5010 Plus Grating Spectrophotometer

OVERVIEW

 

New Model YD5010 Plus Grating Spectrophotometer Densitometer with 45/0(45 ring-shaped illumination, 0 degree viewing angle), comply to standard ISO 5-4,CIE No.15. It is suitable for using in ink printing, in Film Processing, Textile Printing and Dyeing, Plastic Electronics and Other Industries for Color Measurement and Quality Control;especially suitable for the measurement and quality control of optical density and dot enlargement in ink printing; and it is able to customize single aperture Φ2mm,Φ4mm,Φ8mm.

Under the 45/0 geometric optical illumination and the testing conditions of M O, M 1,M 2 , M 3 stipulated by ISO 13655 standard, the instrument can accurately measure the reflectance data of samples. Under multiple color spaces, it can accurately measure various printing density indexes, color difference formulas and color indexes, and can meet the user's regular testing of various parameters.

 

FREATURES

 

1.Perfect combination of the beautiful appearance and the ergonomic structure design;

2.Combined LED light sources with long life and low power consumption, including UV light;

3.Optional apertures: Φ2/4/8mm, adapt to more samples;

4. Accurately measure reflectance spectrum, CMYK density and Lab value of the sample;

5.High-configuration electronic hardware: 3.5-inch TFT true-color screen, capacitive touch screen, concave grating, 256-pixel dual-array CMOS image sensor, etc.;

6.Two standard observer angles: 2/10, multiple light source modes and color systems;

7.USB mode is widely useful;

8.Large-capacity storage space, over 10,000 test data;

9.Especially suitable for process control and quality control of printing plants;

10. PC software has powerful function expansion.

 

SPECIFICATION
 

 

ModelYD5010 Plus
Measurement Geometry45/0(45 ring-shaped illumination, 0 degree viewing angle); ISO 5-4,CIE No.15
Light SourceCombined LED Light, UV Light
Spectral separation deviceConcave Grating
Detector256 Image Element Double Array CMOS Image Sensor
Wavelength Range400~700nm
Wavelength Pitch10nm
Half Bandwidth10nm
Measurement ConditionsCompliance with ISO 13655 measurement conditions;
M0 (CIE Light Soure A)
M1 (CIE Light Soure D50)
M2 (Excluding UV light source)
M3 (M2+Polarized light filter)
Measurement apertureCustomized one aperture:Φ2mm,Φ4mm,Φ8mm optional
Color SpacesCIE LAB,XYZ,Yxy,LCh
Color Difference FormulaΔE*ab,ΔE*94,ΔE*00
Observer Angle2°/10°
IlluminantsA,C,D50,D55,D65,D75,F2,F7,F11,F12
Measurement TimeAbout 1.5s
RepeatabilityDensity: Within 0.01 D
Inter-instrument ErrorWithin ΔE*ab 0.2 (Average for 12 BCRA Series II color tiles) Except M3
Measurement modeSingle Measurement, Average Measurement(2-99)
Size(L*W*H)184*77*105mm
WeightAbout 600g
 

 

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