Shenzhen Wave Optoelectronics Technology Co.,Ltd |
Meter Ferrous Coating Thickness Gauge Lightweight 10 * 10mm Minimum Substrate
Technical Parameter
Model | WH82 |
Principle | Magnetic Method (F-type probe) & Eddy Current Method (NF-type
probe) |
Range | 0-1250um |
Accuracy error | zero calibration ± (1 + 3% H); two-point calibration ± [(1% ~ 3%
H)] H + 1.5 |
Power | 2 * AA battery |
Unit | Um/mil |
Temperature | 0-40 ℃ |
humidity | ≤85% |
Minimum substrate | 10 * 10mm |
Minimum curvature | 5mm convex; 5mm concave |
Thinnest substrate | 0.4mm |
Weight | 99g |
Size | 110mm * 65mm * 30mm |
Product Description
WH82 coating thickness gauge is a portable meter. It is capable of measuring coating
thickness quickly, precisely and without injury, both for the
laboratory and engineering environment. It is currently widely used
in manufacturing, metal processing industry, chemical industry,
commodity inspection and testing fields, and is essential for
material protection major.
Quick detail:
1) Automatic identify ferrous and non-ferrous substrate quickly.
2) Power voltage indicator.
3) Speaker beep while operating.
4) Power-off automatically when idle; manually power-off available.
Principle:
The device uses magnetic thickness measurement method, which
non-destructively measures thickness of non-magnetic coating (such
as: aluminum, chromium, copper, enamel, rubber, paint, etc.) on
magnetic metal substrates (such as steel, iron, alloy and hard
magnetic steel, etc.).
Magnetic Method (F-type probe)
When the probe contacts the cover layer, the probe and magnetic
substrate forms a closed magnetic circuit; Due to the presence of
non-magnetic coating, magnetic resistance changes. The thickness of
the cover layer can be derived by measuring the change.
Eddy Current Method (NF-type probe)
When the probe contacts the cover layer, the probe and non-magnetic
substrate forms Eddy Current and gives feedback to the coil inside
the probe.
The thickness of the cover layer can be derived by measuring the
feedback.