LXT970AQC Electronic IC Chips Dual-Speed Fast Ethernet Transceiver

LXT970A Dual-Speed Fast Ethernet Transceiver

The LXT970A is an enhanced derivative of the LXT970 10/100 Mbps Fast Ethernet PHY Transceiver that supports selectable driver strength capabilities and link-loss criteria. The LXT970A supports 100BASE-TX, 10BASE-T, and 100BASE-FX applications. It provides a Media Independent Interface (MII) for easy attachment to 10/100 Media Access Controllers (MAC)s and a pseudo-ECL interface for use with 100BASE-FX fiber networks.

The LXT970A supports full-duplex operation at 10 and 100 Mbps. Its operating condition is set using auto-negotiation, parallel detection or manual control. The encoder may be bypassed for symbol mode applications.

The LXT970A is fabricated with an advanced CMOS process and requires only a single 5V power supply. The MII may be operated independently with either a 5V or a 3.3V supply.

Applications

■ Combination 10BASE-T/100BASE-TX Network Interface Cards (NICs)

■ 10/100 Switches, 10/100 Printservers

■ 100BASE-FX Network Interface Cards (NICs)

Product Features

■ IEEE 802.3 Compliant:

  —10BASE-T and 100BASE-TX using a single RJ-45 connection.

  —Supports auto-negotiation and parallel detection for legacy systems.

  —MII interface with extended register capability.

■ Robust baseline wander correction performance.

■ 100BASE-FX fiber optic capable.

■ Standard CSMA/CD or full-duplex operation.

■ Configurable via MII serial port or external control pins.

■ Configurable for DTE or switch applications.

■ CMOS process with single 5Vsupply operation with provision for interface to 3.3V MII bus.

■ Integrated LED drivers.

■ Integrated supply monitor and line disconnect during low supply fault.

■ Available in:

  —64-pin TQFP (LXT970ATC)

  —64-pin PQFP (LXT970AQC)

■ Commercial temperature range (0 - 70℃ ambient).

Absolute Maximum Ratings

Caution: Exceeding these values may cause permanent damage. Functional operation under these conditions is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability.

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